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Year
No
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2011
7
M. Mativenga, M. Seok, and J. Jang, “Gate bias-stress induced hump-effect in transfer characteristics of amorphous-indium-galium-zinc-oxide thin-fim transistors with various channel widths,” Appl. Phys. Lett. 99, 122107, September (2011).
2011
6
M. J. Seok, M. H. Choi, M. Mativenga, D. Geng, D. Y. Kim, and J. Jang, “A Full-Swing a-IGZO TFT-Based Inverter with a Top-Gate-Bias-Induced Depletion Load,” IEEE Electron Device Lett. 32, 8, 1089, August (2011).
2011
5
M. Mativenga, M. H. Choi, J. Jang, R. Mruthyunjaya, T. J. Tredwell, E. Mozdy, and C. Kosik-Williams, “Degradation Model of Self-Heating Effects in Silicon-on-Glass TFTs,” IEEE Trans. Electron Devices 58, 8, 2440, August (2011).
2011
4
M. Mativenga, M. H. Choi, D. H. Kang, and J. Jang, “High-Performance Drain-Offset a-IGZO Thin-Film Transistors,” IEEE Electron Device Lett., 32, 5, 644, May (2011).
2011
3
M. Mativenga, M. H. Choi, W. Choi, J. W. Choi, J. Jang, R. Mruthyunjaya, T. J. Tredwell, E. Mozdy, and C. Kosik-Williams, “Reduction of Hot Carrier Effects in Silicon-on-Glass TFTs,” J. Electrochem. Soc., 158, 6, J169, April (2011).
2011
2
M. Mativenga, J. W. Choi, J. H. Hur, H. J. Kim and J. Jang, “Highly stable amorphous indium–gallium–zinc-oxide thin-film transistor using an etch-stopper and a via-hole structure,” Journal of Information Display, 12, 1, 47, March (2011).
2011
1
M. Mativenga, M. H. Choi, J. W. Choi, and J. Jang, “Transparent Flexible Circuits Based on Amorphous-Indium–Gallium–Zinc–Oxide Thin-Film Transistors,” IEEE Electron Device Lett. 32, 2, 170, February (2011).
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